skip to main content

Title: 2D microwave imaging reflectometer electronics

A 2D microwave imaging reflectometer system has been developed to visualize electron density fluctuations on the DIII-D tokamak. Simultaneously illuminated at four probe frequencies, large aperture optics image reflections from four density-dependent cutoff surfaces in the plasma over an extended region of the DIII-D plasma. Localized density fluctuations in the vicinity of the plasma cutoff surfaces modulate the plasma reflections, yielding a 2D image of electron density fluctuations. Details are presented of the receiver down conversion electronics that generate the in-phase (I) and quadrature (Q) reflectometer signals from which 2D density fluctuation data are obtained. Also presented are details on the control system and backplane used to manage the electronics as well as an introduction to the computer based control program.
Authors:
; ; ; ; ;  [1] ;  [2]
  1. Electrical and Computer Engineering, University of California, Davis, California 95616 (United States)
  2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
Publication Date:
OSTI Identifier:
22308621
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; APERTURES; CONTROL SYSTEMS; DENSITY; DOUBLET-3 DEVICE; ELECTRON DENSITY; ELECTRONIC EQUIPMENT; FLUCTUATIONS; MICROWAVE RADIATION; OPTICS; PLASMA; REFLECTION