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Title: Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystals

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.
Authors:
;  [1] ; ;  [2]
  1. National Security Technologies, LLC, Livermore, California 94550 (United States)
  2. Sandia National Laboratories, Albuquerque, New Mexico 87123 (United States)
Publication Date:
OSTI Identifier:
22308602
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; ANODES; CRYSTALS; HOT PLASMA; LINE WIDTHS; PLASTICIZERS; POTASSIUM COMPOUNDS; REFLECTIVITY; SANDIA NATIONAL LABORATORIES; X-RAY DIFFRACTION; X-RAY SOURCES; X-RAY SPECTROMETERS