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Title: Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments

A high resolution 1D imaging x-ray spectrometer concept comprising a spherically bent crystal and a 2D pixelated detector is being optimized for diagnostics of small sources such as high energy density physics (HEDP) and synchrotron radiation or x-ray free electron laser experiments. This instrument is used on tokamak experiments for Doppler measurements of ion temperature and plasma flow velocity profiles. Laboratory measurements demonstrate a resolving power, E/ΔE of order 10 000 and spatial resolution better than 10 μm. Initial tests of the high resolution instrument on HEDP plasmas are being performed.
Authors:
; ; ; ;  [1] ;  [2] ; ; ;  [3]
  1. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
  2. Key Laboratory of Optoelectronic Technology and System of Ministry of Education, Chongqing University, Chongqing 400030 (China)
  3. Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
Publication Date:
OSTI Identifier:
22308595
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; CRYSTALS; ENERGY DENSITY; FREE ELECTRON LASERS; LIGHT SOURCES; PLASMA; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TOKAMAK DEVICES; X-RAY SPECTROMETERS