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Title: Integrated Mg/TiO{sub 2}-ionic liquid system for deep desulfurization

A series of Mg/TiO{sub 2} photocatalysts were prepared using wet impregnation method followed by calcination at 300, 400 and 500°C for 1 h. The photocatalysts were characterized using Thermal Gravimetric Analysis, Fourier-Transform Infrared Spectroscopy, X-Ray Diffraction, and Field Emission Scanning Electron Microscopy. The performance for deep desulfurization was investigated using model oil with 100 ppm sulfur (in the form of dibenzothiophene). The integrated system involves photocatalytic oxidation followed by ionic liquid-extraction processes. The best performing photocatalyst was 0.25wt% Mg loaded on titania calcined at 400°C (0.25Mg400), giving 98.5% conversion of dibenzothiophene to dibenzothiophene sulfone. The highest extraction efficiency of 97.8% was displayed by 1,2-diethylimidazolium diethylphosphate. The overall total sulfur removal was 96.3%.
Authors:
 [1] ; ; ;  [2]
  1. Department of Chemical Engineering, Universiti Teknologi PETRONAS, 31750 Tronoh, Perak (Malaysia)
  2. Department of Fundamental and Applied Sciences, Universiti Teknologi PETRONAS, 31750 Tronoh, Perak (Malaysia)
Publication Date:
OSTI Identifier:
22308054
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1621; Journal Issue: 1; Conference: ICSAS 2014: 3. international conference on fundamental and applied sciences: Innovative research in applied sciences for a sustainable future, Kuala Lumpur (Malaysia), 3-5 Jun 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; CALCINATION; DESULFURIZATION; EXTRACTION; FIELD EMISSION; FOURIER TRANSFORM SPECTROMETERS; IMPREGNATION; LIQUIDS; MOLTEN SALTS; OXIDATION; PERFORMANCE; PHOTOCATALYSIS; REMOVAL; SCANNING ELECTRON MICROSCOPY; SULFUR; THERMAL GRAVIMETRIC ANALYSIS; TITANIUM OXIDES; X-RAY DIFFRACTION