Advances on multijunction solar cell characterization aimed at the optimization of real concentrator performance
- CEA-LITEN, LCPV, INES, Le Bourget du Lac (France)
Multijunction solar cells (MJSC) are usually developed to maximize efficiency under test conditions and not under real operation. This is the case of anti-reflective coatings (ARC), which are meant to minimize Fresnel reflection losses for a family of incident rays at room temperature. In order to understand and quantify the discrepancies between test and operation conditions, we have experimentally analyzed the spectral response of MJSC for a variety of incidence angles that are in practice received by a concentrator cell in high-concentration photovoltaic (HCPV) receiver designs. Moreover, we characterize this angular dependence as a function of temperature in order to reproduce real operation conditions. As the refractive index of the silicone is dependent on temperature, an optical mismatch is expected. Regarding other characterization techniques, a method called Relative EL Homogeneity Analysis (RELHA) is applied to processed wafers prior to dicing, allowing to diagnose the wafer crystalline homogeneity for each junction. Finally, current (I)-voltage (V) characterization under strongly unbalanced light spectra has also been carried out for a number of low-level irradiances, providing insight on each junction shunt resistance and corresponding radiative coupling.
- OSTI ID:
- 22307880
- Journal Information:
- AIP Conference Proceedings, Vol. 1616, Issue 1; Conference: CPV-10: 10. international conference on concentrator photovoltaic systems, Albuquerque, NM (United States), 7-9 Apr 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
14 SOLAR ENERGY
ELECTRIC CONDUCTIVITY
ENERGY EFFICIENCY
INCIDENCE ANGLE
PHOTOVOLTAIC EFFECT
RADIANT FLUX DENSITY
REFLECTION
REFLECTIVE COATINGS
REFRACTIVE INDEX
SEMICONDUCTOR JUNCTIONS
SILICONES
SOLAR CELLS
SPECTRAL RESPONSE
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0273-0400 K
VISIBLE RADIATION