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Title: Fourier plane imaging microscopy

We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane (FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals.
Authors:
;  [1] ;  [2] ; ;  [1] ;  [3] ;  [2]
  1. Department of Physics, Texas Tech University, Lubbock, Texas 79409 (United States)
  2. (United States)
  3. Nano Tech Center, Texas Tech University, Lubbock, Texas 79409 (United States)
Publication Date:
OSTI Identifier:
22306226
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 10; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CAMERAS; CRYSTALS; EXCITATION; FOURIER TRANSFORMATION; IMAGES; MICROSCOPY; NANOSTRUCTURES; OPTICS; PERIODICITY; RESOLUTION; WAVE PROPAGATION