Fourier plane imaging microscopy

Journal Article · Sun Sep 14 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4895157· OSTI ID:22306226

Dominguez, Daniel; Peralta, Luis Grave de ^[1]; Alharbi, Nouf; Alhusain, Mdhaoui ^[1]; Bernussi, Ayrton A. ^[2]

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1. Department of Physics, Texas Tech University, Lubbock, Texas 79409 (United States)
2. Nano Tech Center, Texas Tech University, Lubbock, Texas 79409 (United States)

We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane (FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals.

• OSTI ID: 22306226
• Journal Information: Journal of Applied Physics, Vol. 116, Issue 10; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CAMERAS
CRYSTALS
EXCITATION
FOURIER TRANSFORMATION
IMAGES
MICROSCOPY
NANOSTRUCTURES
OPTICS
PERIODICITY
RESOLUTION
WAVE PROPAGATION