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Title: A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas

X-ray absorption spectroscopy is a powerful tool for the diagnosis of plasmas over a wide range of both temperature and density. However, such a measurement is often limited to probing plasmas with temperatures well below that of the x-ray source in order to avoid object plasma emission lines from obscuring important features of the absorption spectrum. This has excluded many plasmas from being investigated by this technique. We have developed an x-ray spectrometer that provides the ability to record absorption spectra from higher temperature plasmas than the usual approach allows without the risk of data contamination by line radiation emitted by the plasma under study. This is accomplished using a doubly curved mica crystal which is bent both elliptically and cylindrically. We present here the foundational work in the design and development of this spectrometer along with initial results obtained with an aluminum x-pinch as the object plasma.
Authors:
; ; ; ;  [1]
  1. Cornell University, Electrical and Computer Engineering, Ithaca, NY 14853 (United States)
Publication Date:
OSTI Identifier:
22305877
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 10; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ALUMINIUM; CRYSTALS; CYLINDRICAL CONFIGURATION; HOT PLASMA; MICA; PLASMA DIAGNOSTICS; X-RAY SOURCES; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY