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Title: Single atom impurity in a single molecular transistor

The influence of an impurity atom on the electrostatic behaviour of a Single Molecular Transistor was investigated through Ab-initio calculations in a double-gated geometry. The charge stability diagram carries unique signature of the position of the impurity atom in such devices which together with the charging energy of the molecule could be utilised as an electronic fingerprint for the detection of such impurity states in a nano-electronic device. The two gated geometry allows additional control over the electrostatics as can be seen from the total energy surfaces (for a specific charge state), which is sensitive to the positions of the impurity. These devices which are operational at room temperature can provide significant advantages over the conventional silicon based single dopant devices functional at low temperature. The present approach could be a very powerful tool for the detection and control of individual impurity atoms in a single molecular device and for applications in future molecular electronics.
Authors:
 [1]
  1. Institute of Materials Science, Technical University of Darmstadt, Alarich-Weiss Str. 2, 64287 Darmstadt (Germany)
Publication Date:
OSTI Identifier:
22305837
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ATOMS; CHARGE STATES; DETECTION; ELECTRONIC EQUIPMENT; ELECTROSTATICS; IMPURITIES; MOLECULES; NANOELECTRONICS; NANOSTRUCTURES; SILICON; STABILITY; SURFACES; TEMPERATURE RANGE 0273-0400 K; TRANSISTORS