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Title: Amorphous FeCoSiB for exchange bias coupled and decoupled magnetoelectric multilayer systems: Real-structure and magnetic properties

Abstract

The effect of field annealing for exchanged biased multilayer films is studied with respect to the resultant structural and magnetic film properties. The presented multilayer stacks comprise repeating sequences of Ta/Cu/(1 1 1) textured antiferromagnetic Mn₇₀Ir₃₀ /amorphous ferromagnetic Fe₇₀.₂Co₇.₈Si₂B₁₀. Within the ferromagnetic layers crystalline filaments are observed. An additional Ta layer between the antiferromagnet and ferromagnet is used in order to investigate and separate the influence of the common Mn₇₀Ir₃₀/Fe₇₀.₂Co₇.₈Si₁₂B₁₀ interface on the occurring filaments and structural changes. In situ and ex situ transmission electron microscopy is used for a comprehensive structure characterization of multilayer stacks for selected temperature stages. Up to 250 °C, the multilayers are structurally unaltered and preserve the as-deposited condition. A deliberate increase to 350 °C exhibits different crystallization processes for the films, depending on the presence of crystal nuclei within the amorphous ferromagnetic layer. The influence of volume-to-surface ratio of the multilayer stacks to the crystallization process is emphasized by the comparison of in situ and ex situ investigations as the respective specimen thickness is changed. Complementary magnetic studies reveal a defined exchange bias obtained at the first annealing step and a decrease of total anisotropy field with partial crystallization after the subsequent annealing atmore » 350 °C.« less

Authors:
; ;  [1];  [2];  [3]; ;  [1]
  1. Inorganic Functional Materials, Institute for Materials Science CAU Kiel, Kaiserstr. 2, 24143 Kiel (Germany)
  2. Synthesis and Real Structure, Institute for Materials Science CAU Kiel, Kaiserstr. 2, 24143 Kiel (Germany)
  3. Nanoscale Magnetic Materials, Institute for Materials Science CAU Kiel, Kaiserstr. 2, 24143 Kiel (Germany)
Publication Date:
OSTI Identifier:
22305763
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 13; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AMORPHOUS STATE; ANISOTROPY; ANNEALING; ANTIFERROELECTRIC MATERIALS; BORON COMPOUNDS; COBALT COMPOUNDS; COPPER; CRYSTALLIZATION; ELECTRICAL PROPERTIES; FERROMAGNETIC MATERIALS; IRIDIUM COMPOUNDS; IRON COMPOUNDS; MAGNETIC PROPERTIES; MANGANESE COMPOUNDS; QUATERNARY ALLOY SYSTEMS; SILICON COMPOUNDS; SURFACES; TEMPERATURE RANGE 0400-1000 K; THALLIUM; TRANSMISSION ELECTRON MICROSCOPY

Citation Formats

Hrkac, V., Strobel, J., Kienle, L., E-mail: lk@tf.uni-kiel.de, Lage, E., Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Mass. Ave., Cambridge 02139, Massachusetts, Köppel, G., Nanostructured Silicon for Photonic and Photovoltaic Implementations, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kekuléstr. 5, 12489 Berlin, McCord, J., Quandt, E., and Meyners, D. Amorphous FeCoSiB for exchange bias coupled and decoupled magnetoelectric multilayer systems: Real-structure and magnetic properties. United States: N. p., 2014. Web. doi:10.1063/1.4896662.
Hrkac, V., Strobel, J., Kienle, L., E-mail: lk@tf.uni-kiel.de, Lage, E., Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Mass. Ave., Cambridge 02139, Massachusetts, Köppel, G., Nanostructured Silicon for Photonic and Photovoltaic Implementations, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kekuléstr. 5, 12489 Berlin, McCord, J., Quandt, E., & Meyners, D. Amorphous FeCoSiB for exchange bias coupled and decoupled magnetoelectric multilayer systems: Real-structure and magnetic properties. United States. https://doi.org/10.1063/1.4896662
Hrkac, V., Strobel, J., Kienle, L., E-mail: lk@tf.uni-kiel.de, Lage, E., Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Mass. Ave., Cambridge 02139, Massachusetts, Köppel, G., Nanostructured Silicon for Photonic and Photovoltaic Implementations, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kekuléstr. 5, 12489 Berlin, McCord, J., Quandt, E., and Meyners, D. 2014. "Amorphous FeCoSiB for exchange bias coupled and decoupled magnetoelectric multilayer systems: Real-structure and magnetic properties". United States. https://doi.org/10.1063/1.4896662.
@article{osti_22305763,
title = {Amorphous FeCoSiB for exchange bias coupled and decoupled magnetoelectric multilayer systems: Real-structure and magnetic properties},
author = {Hrkac, V. and Strobel, J. and Kienle, L., E-mail: lk@tf.uni-kiel.de and Lage, E. and Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Mass. Ave., Cambridge 02139, Massachusetts and Köppel, G. and Nanostructured Silicon for Photonic and Photovoltaic Implementations, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kekuléstr. 5, 12489 Berlin and McCord, J. and Quandt, E. and Meyners, D.},
abstractNote = {The effect of field annealing for exchanged biased multilayer films is studied with respect to the resultant structural and magnetic film properties. The presented multilayer stacks comprise repeating sequences of Ta/Cu/(1 1 1) textured antiferromagnetic Mn₇₀Ir₃₀ /amorphous ferromagnetic Fe₇₀.₂Co₇.₈Si₂B₁₀. Within the ferromagnetic layers crystalline filaments are observed. An additional Ta layer between the antiferromagnet and ferromagnet is used in order to investigate and separate the influence of the common Mn₇₀Ir₃₀/Fe₇₀.₂Co₇.₈Si₁₂B₁₀ interface on the occurring filaments and structural changes. In situ and ex situ transmission electron microscopy is used for a comprehensive structure characterization of multilayer stacks for selected temperature stages. Up to 250 °C, the multilayers are structurally unaltered and preserve the as-deposited condition. A deliberate increase to 350 °C exhibits different crystallization processes for the films, depending on the presence of crystal nuclei within the amorphous ferromagnetic layer. The influence of volume-to-surface ratio of the multilayer stacks to the crystallization process is emphasized by the comparison of in situ and ex situ investigations as the respective specimen thickness is changed. Complementary magnetic studies reveal a defined exchange bias obtained at the first annealing step and a decrease of total anisotropy field with partial crystallization after the subsequent annealing at 350 °C.},
doi = {10.1063/1.4896662},
url = {https://www.osti.gov/biblio/22305763}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 13,
volume = 116,
place = {United States},
year = {Tue Oct 07 00:00:00 EDT 2014},
month = {Tue Oct 07 00:00:00 EDT 2014}
}