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Title: Ferroic characterizations, phase transformation, and internal bias field in 0.75Pb(Fe{sub 2/3}W{sub 1/3})O{sub 3}–0.25PbTiO{sub 3} multiferroic ceramic

The complex perovskite of 0.75Pb(Fe{sub 2/3}W{sub 1/3})O{sub 3}–0.25PbTiO{sub 3} (0.75PFW-0.25PT) ceramic was prepared by the conventional oxide mixing method. The detailed microstructure of 0.75PFW-0.25PT ceramic was investigated. At room temperature, the TEM analysis reveals that only cubic structure (nonpolar) exists, which is different from the phase coexistence of cubic (66%) and tetragonal (34%) structure revealed by XRD. A mechanism dominated by a temperature rise due to electron-beam irradiation has been proposed. The XPS measurement confirms the mixed balance state of Fe{sup 2+} and Fe{sup 3+} in the as-prepared 0.75PFW-0.25PT specimen, which facilitates the formation of the defect dipoles with oxygen vacancies, in turn resulting in the internal-bias field (E{sub i}) phenomenon. The appearance of weak magnetic interactions is believed relating to the presence of noncompensated magnetic moments in Fe-rich islands. These results provide key information for understanding the composition, defect, ferroelectric, and ferromagnetic properties in 0.75PFW-0.25PT ceramic.
Authors:
; ; ;  [1]
  1. College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124 (China)
Publication Date:
OSTI Identifier:
22305717
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 12; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CERAMICS; DEFECTS; DIPOLES; ELECTRON BEAMS; FERROELECTRIC MATERIALS; IRON COMPOUNDS; LEAD COMPOUNDS; MAGNETIC MOMENTS; MICROSTRUCTURE; MIXING; OXYGEN COMPOUNDS; PEROVSKITE; PHASE TRANSFORMATIONS; TEMPERATURE RANGE 0273-0400 K; TITANATES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY