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Title: Infrared near-field imaging and spectroscopy based on thermal or synchrotron radiation

We demonstrate the coupling of a scattering near-field scanning optical microscope combined with a Fourier transform infrared spectrometer. The set-up operates using either the near-field thermal emission from the sample itself, which is proportional to the electromagnetic local density of states, or with an external infrared synchrotron source, which is broadband and highly brilliant. We perform imaging and spectroscopy measurements with sub-wavelength spatial resolution in the mid-infrared range on surfaces made of silicon carbide and gold and demonstrate the capabilities of the two configurations for super-resolved near-field mid-infrared hyperspectral imaging and that the simple use of a properly chosen bandpass filter on the detector allows one to image the spatial distribution of materials with sub-wavelength resolution by studying the contrast in the near-field images.
Authors:
;  [1] ; ;  [2]
  1. ESPCI ParisTech, PSL Research University, CNRS, Institut Langevin, 1 rue Jussieu, F-75005, Paris (France)
  2. Société Civile Synchrotron SOLEIL, L'Orme des Merisiers, St-Aubin BP48, 91192 Gif-sur-Yvette Cedex (France)
Publication Date:
OSTI Identifier:
22304451
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 25; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COUPLING; EMISSION; FILTERS; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; GOLD; INFRARED SPECTROMETERS; OPTICAL MICROSCOPES; SCATTERING; SILICON CARBIDES; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; SPECTROSCOPY; SURFACES; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; THERMAL RADIATION; WAVELENGTHS