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Title: Phase transitions in [001]-oriented morphotropic PbZr{sub 0.52}Ti{sub 0.48}O{sub 3} thin film deposited onto SrTiO{sub 3}-buffered Si substrate

An 85 nm-thick morphotropic PbZr{sub 0.52}Ti{sub 0.48}O{sub 3} (PZT) film grown epitaxially and [001]-oriented onto a SrTiO{sub 3}-buffered Si-wafer is investigated using temperature dependent X-ray diffraction. Two phase transitions, at T{sub rt} ∼ 500 K and T{sub c} ∼ 685 K, are evidenced and are attributed to structural phase transitions from monoclinic-like to tetragonal-like phase and from tetragonal to paraelectric phase, respectively. The stronger upper shift of T{sub rt} value with respect to the bulk one and the weakly affected T{sub c} (T{sub c} bulk ∼ 665 K) are explained assuming misfit strain changes when crossing T{sub rt}. This finding opens new perspectives for piezoelectric PZT films in harsh applications.
Authors:
 [1] ;  [2] ; ; ;  [1] ; ; ; ; ; ;  [3] ; ; ;  [4]
  1. CEA, LETI, Minatec Campus, 17 Rue des Martyrs, 38054 Grenoble (France)
  2. (UMR5270/CNRS), Ecole Centrale de Lyon, 36 avenue Guy de Collongue, F-69134 Ecully cedex (France)
  3. Universite de Lyon, Institut des Nanotechnologies de Lyon (UMR5270/CNRS), Ecole Centrale de Lyon, 36 avenue Guy de Collongue, F-69134 Ecully cedex (France)
  4. Laboratoire Structures, Propriétés et Modélisation des Solides (SPMS), Ecole Centrale Paris, CNRS-UMR8580, F-92290 Châtenay-Malabry (France)
Publication Date:
OSTI Identifier:
22304220
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 21; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BUFFERS; EPITAXY; LEAD COMPOUNDS; MONOCLINIC LATTICES; NANOSTRUCTURES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PIEZOELECTRICITY; PZT; SILICON; STRAINS; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TITANIUM COMPOUNDS; X-RAY DIFFRACTION; ZIRCONIUM COMPOUNDS