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Title: Atomic resolution electrostatic potential mapping of graphene sheets by off-axis electron holography

Off-axis electron holography has been performed at atomic resolution with the microscope operated at 80‚ÄČkV to provide electrostatic potential maps from single, double, and triple layer graphene. These electron holograms have been reconstructed in order to obtain information about atomically resolved and mean inner potentials. We propose that off-axis electron holography can now be used to measure the electrical properties in a range of two-dimensional semiconductor materials and three dimensional devices comprising stacked layers of films to provide important information about their electrical properties.
Authors:
 [1] ;  [2] ; ;  [3]
  1. University Grenoble Alpes, F-38000 Grenoble (France)
  2. (France)
  3. School of Materials, The University of Manchester, Manchester M13 9PL (United Kingdom)
Publication Date:
OSTI Identifier:
22304003
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 23; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRICAL PROPERTIES; ELECTRONS; ELECTROSTATICS; EQUIPMENT; FILMS; GRAPHENE; HOLOGRAPHY; LAYERS; RESOLUTION; SEMICONDUCTOR MATERIALS; TWO-DIMENSIONAL CALCULATIONS