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Title: Electronic transport and conduction mechanism transition in La{sub 1∕3}Sr{sub 2∕3}FeO{sub 3} thin films

We report on the electronic transport properties of epitaxial La{sub 1∕3}Sr{sub 2∕3}FeO{sub 3} films using temperature dependent resistivity, Hall effect, and magnetoresistance measurements. We show that the electronic phase transition, which occurs near 190 K, results in a change in conduction mechanism from nonadiabatic polaron transport at high temperatures to resistivity behavior following a power law temperature dependence at low temperatures. The phase transition is also accompanied by an abrupt increase in apparent mobility and Hall coefficient below the critical temperature (T*). We argue that the exotic low temperature transport properties are a consequence of the unusually long-range periodicity of the antiferromagnetic ordering, which also couples to the electronic transport in the form of a negative magnetoresistance below T* and a sign reversal of the Hall coefficient at T*. By comparing films of differing thicknesses, stoichiometry, and strain states, we demonstrate that the observed conduction behavior is a robust feature of La{sub 1∕3}Sr{sub 2∕3}FeO{sub 3}.
Authors:
; ; ; ;  [1]
  1. Department of Materials Science and Engineering, Drexel University, Philadelphia, Pennsylvania 19104 (United States)
Publication Date:
OSTI Identifier:
22303999
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 23; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANTIFERROMAGNETISM; CARRIER MOBILITY; CRITICAL TEMPERATURE; ELECTRIC CONDUCTIVITY; EPITAXY; FERRITES; HALL EFFECT; LANTHANUM COMPOUNDS; MAGNETORESISTANCE; PERIODICITY; PHASE TRANSFORMATIONS; STOICHIOMETRY; STRAINS; STRONTIUM COMPOUNDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; THICKNESS; THIN FILMS