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Title: Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures

By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underlying ferroelectric substrate upon which it is grown. Simultaneous imaging allows straightforward, quantitative measurements of the correlations in these complex multiferroic systems. We have successfully imaged domains in CoFe/BFO and Fe/BTO, two systems with very different ferromagnet/ferroelectric coupling mechanisms, demonstrating how this technique provides a new local probe of magneto electric/strictive effects in multiferroic heterostructures.
Authors:
;  [1] ;  [1] ;  [2] ;  [3] ;  [4] ;  [3] ;  [2] ;  [5] ; ;  [6]
  1. Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
  2. (United States)
  3. Department of Materials Science and Engineering, University of California, Berkeley, California 94720 (United States)
  4. (Switzerland)
  5. Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854 (United States)
  6. Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742 (United States)
Publication Date:
OSTI Identifier:
22303731
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 2; Journal Issue: 7; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DOMAIN STRUCTURE; FERROELECTRIC MATERIALS; SCANNING ELECTRON MICROSCOPY; SPIN ORIENTATION; SUBSTRATES; THIN FILMS