2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

Journal Article · Sat Nov 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4891975· OSTI ID:22303699

Ido, T.; Kato, S.; Hamada, Y. ^[1]; Kurachi, M.; Makino, R. ^[2]; Nishiura, M. ^[3]; Nishizawa, A. ^[4]

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1. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)
2. Graduate School of Engineering, Nagoya University, Chikusa, Nagoya 464-8603 (Japan)
3. Graduate School of Frontier Sciences, The University of Tokyo, Chiba 277-8561 (Japan)
4. Pesco Corporation Limited, Toki, Gifu 509-5123 (Japan)

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.

• OSTI ID: 22303699
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
BEAM TRANSPORT
HEAVY IONS
ION BEAMS
ION PROBES
LHD DEVICE
TWO-DIMENSIONAL CALCULATIONS