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Title: Direct real space observation of magneto-electronic inhomogeneity in ultra-thin film La{sub 0.5}Sr{sub 0.5}CoO{sub 3−δ} on SrTiO{sub 3}(001)

Recent magnetotransport and neutron scattering measurements implicate interfacial magneto-electronic phase separation as the origin of the degradation in transport and magnetism in ultra-thin film La{sub 1−x}Sr{sub x}CoO{sub 3} on SrTiO{sub 3}(001). Here, using low temperature scanning tunneling microscopy and spectroscopy the first direct, real space observation of this nanoscopic electronic inhomogeneity is provided. Films of thickness 12.4 nm (32 unit cells) are found to exhibit spatially uniform conductance, in stark contrast to 4.7 nm (12 unit cell) films that display rich variations in conductance, and thus local density of states. The electronic heterogeneity occurs across a hierarchy of length scales (5–50 nm), with complex correlations with both topography and applied magnetic fields. These results thus provide a direct observation of magneto-electronic inhomogeneity in SrTiO{sub 3}(001)/La{sub 0.5}Sr{sub 0.5}CoO{sub 3} at thicknesses below 6–7 nm, in good agreement with less direct techniques.
Authors:
; ;  [1] ; ; ;  [2]
  1. Department of Physics, Leiden University, 2300 RA Leiden (Netherlands)
  2. Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
Publication Date:
OSTI Identifier:
22303529
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COBALT COMPOUNDS; CORRELATIONS; DENSITY; LANTHANUM COMPOUNDS; MAGNETIC FIELDS; MAGNETISM; MAGNETORESISTANCE; NEUTRON DIFFRACTION; OXYGEN COMPOUNDS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; STRONTIUM COMPOUNDS; STRONTIUM TITANATES; THICKNESS; THIN FILMS; TOPOGRAPHY