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Title: An interface facet driven Rayleigh instability in high-aspect-ratio bimetallic nanolayered composites

One limitation hindering the structural and electrical applications of nanostructured metals is the loss of their nanostructure and strength under elevated temperatures. Nanostructured metals often have grain structures that contain a high density of triple junctions, where thermally induced instabilities commonly initiate. Prior work has resulted in fabrication of nanolayered two-phase composites that possess high-aspect ratio grains, a scarcity of triple junctions, and a thermally stable microstructure. In this work, transmission electron microscopy is used to investigate how these composites could eventually breakdown during heating. We reveal an unconventional thermal instability mechanism in this class of materials, which operates without the assistance of triple junctions. The mechanism can be rationalized by that thermally induced pinch off occurs as the result of bimetal interface faceting and can trigger a classic Rayleigh instability.
Authors:
;  [1] ;  [2] ;  [3] ;  [4]
  1. Center for Integrated Nanotechnologies, MPA-CINT, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  2. Materials Science and Technology Division, MST-6, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  3. Materials Science and Technology Division, MST-8, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  4. Theoretical Division, T-3, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Publication Date:
OSTI Identifier:
22303501
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ASPECT RATIO; BIMETALS; BREAKDOWN; DENSITY; ELECTRIC CONTACTS; FABRICATION; INSTABILITY; INTERFACES; LAYERS; METALS; MICROSTRUCTURE; NANOSTRUCTURES; RAYLEIGH-TAYLOR INSTABILITY; SEMICONDUCTOR JUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY