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Title: Momentum transfer driven textural changes of CeO{sub 2} thin films

The influence of the target erosion depth on the film texture was investigated during DC reactive magnetron sputter deposition of CeO{sub 2} thin films. Three fluxes towards the substrate surface (the relative negative oxygen ion flux, the material flux, and the energy flux) were measured and related to the ongoing erosion of a cerium target. As the deposition rate increased for more eroded targets, both the energy flux and the negative ion flux decreased. Cerium oxide thin films that were deposited at different target erosion states, exhibited a change in preferential crystalline orientation from [200] to [111]. This textural change cannot be explained in terms of the energy per arriving atom concept. Instead, it is shown that the momentum of the high energetic negative ions is an essential condition to clarify the witnessed trends.
Authors:
; ;  [1] ;  [2]
  1. Department of Solid State Sciences, Ghent University, Krijgslaan 281/S1, 9000 Ghent (Belgium)
  2. Department of Materials and Chemistry, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels (Belgium)
Publication Date:
OSTI Identifier:
22303497
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANIONS; CERIUM; CERIUM OXIDES; DEPOSITION; EROSION; MAGNETRONS; MOMENTUM TRANSFER; ORIENTATION; OXYGEN IONS; SPUTTERING; SUBSTRATES; SURFACES; TEXTURE; THIN FILMS