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Title: Electronic structure evolution in doping of fullerene (C{sub 60}) by molybdenum trioxide

Molybdenum oxide doping of fullerene has been investigated using ultraviolet photoemission spectroscopy (UPS), X-ray photoemission spectroscopy (XPS), and inverse photoemission spectroscopy (IPES). The lowest unoccupied molecular orbital and the highest occupied molecular orbital (HOMO) can be observed directly with IPES and UPS. It is observed that the Fermi level position in fullerene is modified by molybdenum oxide doping, and the HOMO onset is shifted to less than 0.3‚ÄČeV below the Fermi level. The energy level shift is found to saturate at doping ratio of 18%. Till this stage, the shift depends on the doping concentration in a semi-logarithmic scale, with a slope substantially higher than that of the traditional semiconductor theory. The XPS results indicate that charge transfer continues beyond the energy level shift saturation till the doping ratio reaches 66% as evidenced by the Mo{sup 5+} component. At higher doping concentration, there is more Mo{sup 6+} component, which indicates the saturation of the charge transfer between MoO{sub x} and C{sub 60}.
Authors:
 [1] ;  [1] ;  [2]
  1. Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627 (United States)
  2. (China)
Publication Date:
OSTI Identifier:
22303496
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRONIC STRUCTURE; EV RANGE; FERMI LEVEL; FULLERENES; MOLECULAR ORBITAL METHOD; MOLYBDENUM IONS; MOLYBDENUM OXIDES; PHOTOEMISSION; SATURATION; SEMICONDUCTOR MATERIALS; ULTRAVIOLET RADIATION; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY