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Title: Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches

The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region.
Authors:
;  [1] ;  [2]
  1. NOVITAS, Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798 (Singapore)
  2. Temasek Laboratories at Nanyang Technological University, Research Techno Plaza, Singapore 637553 (Singapore)
Publication Date:
OSTI Identifier:
22303396
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 25; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRONS; FILMS; FLUCTUATIONS; GOLD; HYDROCARBONS; INTERFACES; LAYERS; MICROSTRUCTURE; NOISE; SWITCHES; TRAPS