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Title: Microwave losses in MgO, LaAlO{sub 3}, and (La{sub 0.3}Sr{sub 0.7})(Al{sub 0.65}Ta{sub 0.35})O{sub 3} dielectrics at low power and in the millikelvin temperature range

We have investigated both the temperature and the power dependence of microwave losses for various dielectrics commonly used as substrates for the growth of high critical temperature superconductor thin films. We present measurement of niobium superconducting λ∕2 coplanar waveguide resonators, fabricated on MgO, LaAlO{sub 3}, and (La{sub 0.3}Sr{sub 0.7})(Al{sub 0.65}Ta{sub 0.35})O{sub 3} (LSAT), at the millikelvin temperature range and at low input power. By comparing our results with the two-level system model, we have discriminated among different dominant loss mechanisms. LSAT has shown the best results as regards the dielectric losses in the investigated regimes.
Authors:
; ;  [1]
  1. Department of Microtechnology and Nanoscience (MC2), Chalmers University of Technology, SE-412 96 Göteborg (Sweden)
Publication Date:
OSTI Identifier:
22300151
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 21; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINATES; CRITICAL TEMPERATURE; DIELECTRIC MATERIALS; LANTHANUM COMPOUNDS; LOSSES; MAGNESIUM OXIDES; MICROWAVE RADIATION; NIOBIUM; STRONTIUM COMPOUNDS; SUPERCONDUCTORS; TANTALUM COMPOUNDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; THIN FILMS; WAVEGUIDES