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Title: Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high spatial resolution. Using ErMnO{sub 3} as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contact-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.
Authors:
;  [1] ;  [2] ;  [3] ; ; ; ;  [4] ;  [5] ;  [6] ;  [7] ; ;  [8] ;  [8] ;  [7]
  1. Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, 8093 Zurich (Switzerland)
  2. Institut für Optik und Atomare Physik, TU Berlin, Hardenbergstrasse 36, 10623 Berlin (Germany)
  3. (PGI-6), Leo-Brandt-Strasse, 52425 Jülich (Germany)
  4. Forschungszentrum Jülich Peter Grünberg Institute (PGI-6), Leo-Brandt-Strasse, 52425 Jülich (Germany)
  5. CNRS, Univ. Bordeaux, ICMCB, UPR 9048, F-33600 Pessac (France)
  6. 4th Physics Institute and Research Center SCoPE, University of Suttgart, Pfaffenwaldring 57, 70659 Stuttgart (Germany)
  7. (United States)
  8. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
Publication Date:
OSTI Identifier:
22300034
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 23; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DOMAIN STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; ENERGY SPECTRA; ERBIUM COMPOUNDS; FERROELECTRIC MATERIALS; MANGANATES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SPATIAL RESOLUTION; X RADIATION; X-RAY EMISSION ANALYSIS