skip to main content

SciTech ConnectSciTech Connect

Title: Reactive ion etching-assisted surface-enhanced Raman scattering measurements on the single nanoparticle level

Single-nanoparticle surface-enhanced Raman scattering (SERS) measurement is of essential importance for both fundamental research and practical applications. In this work, we develop a class of single-particle SERS approaches, i.e., reactive ion etching (RIE)-assisted SERS measurements correlated with scanning electron microscopy (SEM) strategy (RIE/SERS/SEM), enabling precise and high-resolution identification of single gold nanoparticle (AuNP) in facile and reliable manners. By using AuNP-coated silicon wafer and quartz glass slide as models, we further employ the developed RIE/SERS/SEM method for interrogating the relationship between SERS substrates and enhancement factor (EF) on the single particle level. Together with theoretical calculation using an established finite-difference-time-domain (FDTD) method, we demonstrate silicon wafer as superior SERS substrates, facilitating improvement of EF values.
Authors:
; ; ; ;  [1] ;  [1] ;  [2]
  1. Institute of Functional Nano and Soft Materials - FUNSOM, Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices, and Devices Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou, Jiangsu 215123 (China)
  2. (COSDAF), City University of Hong Kong, Hong Kong, China and Department of Physics and Materials Science, City University of Hong Kong, Hong Kong (China)
Publication Date:
OSTI Identifier:
22299914
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ETCHING; GLASS; GOLD; IONS; PARTICLES; RAMAN EFFECT; RESOLUTION; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; SURFACES