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Title: Measuring inside damage of individual multi-walled carbon nanotubes using scanning transmission X-ray microscopy

The electronic structure of individual multi-walled carbon nanotubes (MWCNTs) has been probed using scanning transmission X-ray microscopy (STXM). Although transmission electron microscope (TEM) images show that the exterior of the MWCNTs are clean and straight; the inside structure of some of the MWCNTs is much less well ordered, as revealed by STXM. The amorphization of the interior tubes can be introduced in the growth or modification processes. Moreover, TEM measurement with high dose may also lead to the inside damage. Our results reveal that the structure of individual MWCNTs can be complex and suggest that electronic structure measurements are an important tool for characterizing carbon nanomaterials.
Authors:
; ; ; ;  [1] ;  [2]
  1. Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)
  2. Canadian Light Source, Inc., University of Saskatchewan, Saskatoon, Saskatchewan S7N 0X4 (Canada)
Publication Date:
OSTI Identifier:
22299880
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; AMORPHOUS STATE; CARBON NANOTUBES; CRYSTAL GROWTH; DAMAGE; ELECTRONIC STRUCTURE; MODIFICATIONS; TRANSMISSION; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION