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Title: Electron tomography of dislocation structures

Recent developments in the application of electron tomography for characterizing microstructures in crystalline solids are described. The underlying principles for electron tomography are presented in the context of typical challenges in adapting the technique to crystalline systems and in using diffraction contrast imaging conditions. Methods for overcoming the limitations associated with the angular range, the number of acquired images, and uniformity of image contrast are introduced. In addition, a method for incorporating the real space coordinate system into the tomogram is presented. As the approach emphasizes development of experimental solutions to the challenges, the solutions developed and implemented are presented in the form of examples.
Authors:
; ;  [1] ; ;  [2] ;  [1] ;  [3]
  1. Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, 1304 W. Green St., Urbana, IL 61801 (United States)
  2. Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395 (Japan)
  3. (United States)
Publication Date:
OSTI Identifier:
22288717
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 87; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COORDINATES; DIFFRACTION; DISLOCATIONS; ELECTRONS; MICROSTRUCTURE; SOLIDS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY