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Title: Microstructure and texture evolution of Cu–Nb composite wires

The evolution of microstructure and texture in Cu–Nb composite wires fabricated by an accumulative drawing and bundling process was investigated by backscattered electron (BSE), electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). Results indicate the onset of severe curling and shape changing occurred at the size of Nb ∼ 400 nm with a surface increase of about 6.91 μm{sup 2}/μm{sup 3} (the area per unit volume). Two kinds of grain boundaries in Nb are suggested: one is 20°–50° boundary with a rotate/tilt axis around <110> parallel to drawing direction (DD), and another is > 50° boundary with the axis perpendicular to DD. The curling phenomenon occurred at the Cu–Nb interface and is related not only to the deformation mechanism of Nb but also to the presence of interface. This result is distinct from reported works showing that curling takes place when BCC metals are heavily drawn (Area reduction > 73%). The variation in microstructure and texture evolution between Cu and Nb filaments was discussed based on the differences in deformation mechanisms of these two metals. - Highlights: • Microstructure and texture evolution were studied systematically by EBSD. • In Nb, grain boundaries of 20°–50° have a rotate/tile axis aroundmore » <110>//DD. • The rotation axes of above 50° boundaries are concentrated around <111> ⊥ DD in Nb. • Curling is related to not only deformation mode of BCC but also Cu–Nb interface.« less
Authors:
 [1] ;  [2] ;  [1] ;  [3] ; ;  [4] ;  [1]
  1. College of Materials Science and Engineering, Chongqing University, Chongqing 400044 (China)
  2. (United States)
  3. National High Magnetic Field Laboratory, Tallahassee, FL 32310 (United States)
  4. Northwest Institute for Nonferrous Metal Research, Xi'an 710016 (China)
Publication Date:
OSTI Identifier:
22285062
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 81; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BACKSCATTERING; BCC LATTICES; DEFORMATION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; TEXTURE; TRANSMISSION ELECTRON MICROSCOPY