skip to main content

Title: Direct imaging of enhanced current collection on grain boundaries of Cu(In,Ga)Se{sub 2} solar cells

We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se{sub 2} solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.
Authors:
 [1] ;  [2] ;  [1] ; ; ;  [3]
  1. Department of Physics, Incheon National University, Incheon 406-772 (Korea, Republic of)
  2. (NREL), Golden, Colorado 80401 (United States)
  3. National Center for Photovoltaics, National Renewable Energy Laboratory (NREL), Golden, Colorado 80401 (United States)
Publication Date:
OSTI Identifier:
22283198
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; COPPER SELENIDES; ELECTRIC CURRENTS; ELECTRIC FIELDS; GALLIUM SELENIDES; GRAIN BOUNDARIES; INDIUM SELENIDES; SOLAR CELLS; THIN FILMS