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Title: Entanglement-assisted electron microscopy based on a flux qubit

A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.
Authors:
 [1] ;  [2]
  1. Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan)
  2. National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)
Publication Date:
OSTI Identifier:
22283155
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; MAGNETIC FLUX; QUANTUM ENTANGLEMENT; QUBITS; RADIATION EFFECTS; RADIOWAVE RADIATION; RESOLUTION; SQUID DEVICES; SUPERCONDUCTORS; TRANSMISSION ELECTRON MICROSCOPY