skip to main content

SciTech ConnectSciTech Connect

Title: Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN

The influence of substrate miscut on Al{sub 0.5}Ga{sub 0.5}‚ÄČN layers was investigated using cathodoluminescence (CL) hyperspectral imaging and secondary electron imaging in an environmental scanning electron microscope. The samples were also characterized using atomic force microscopy and high resolution X-ray diffraction. It was found that small changes in substrate miscut have a strong influence on the morphology and luminescence properties of the AlGaN layers. Two different types are resolved. For low miscut angle, a crack-free morphology consisting of randomly sized domains is observed, between which there are notable shifts in the AlGaN near band edge emission energy. For high miscut angle, a morphology with step bunches and compositional inhomogeneities along the step bunches, evidenced by an additional CL peak along the step bunches, are observed.
Authors:
; ; ;  [1] ; ;  [2] ;  [3] ;  [2]
  1. Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG (United Kingdom)
  2. Tyndall National Institute, University College Cork, Lee Maltings, Dyke Parade, Cork (Ireland)
  3. (Ireland)
Publication Date:
OSTI Identifier:
22283029
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 9; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; ELECTRONIC STRUCTURE; ELECTRONS; GALLIUM NITRIDES; LAYERS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; X-RAY DIFFRACTION