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Title: Microscopic theory of elastico-mechanoluminescent smart materials

The concepts of piezoelectric field dependence of the detrapping probability and lifetime of charge carriers in traps are developed. The charge carriers in traps become unstable after a particular piezoelectric field whereby more number of charge carriers are detrapped with increasing piezoelectric field. The detrapped electrons tunnel to the energy level of the hole-captured activator ions lying adjacent to the conduction band or tunnel to conduction band. Subsequently, luminescence is induced by the electron-hole recombination. Using these concepts microscopic theory of elastico-mechanoluminescent smart materials is explored. Present study may be useful in tailoring intense elastico-mechanoluminescent materials needed for different applications.
Authors:
;  [1] ;  [2]
  1. Department of Postgraduate Studies and Research in Physics and Electronics, Rani Durgavati University, Jabalpur 482001, MP (India)
  2. Department of Electrical and Electronics Engineering, Chhatrapati Shivaji Institute of Technology, Shivaji Nagar, Kolihapuri, Durg 491001, CG (India)
Publication Date:
OSTI Identifier:
22280615
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CAPTURE; CHARGE CARRIERS; ELASTICITY; ELECTRONIC STRUCTURE; ENERGY LEVELS; HOLES; LIFETIME; LUMINESCENCE; PIEZOELECTRICITY; PROBABILITY; RECOMBINATION; TRAPS