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Title: Electronic and elemental properties of the Cu{sub 2}ZnSn(S,Se){sub 4} surface and grain boundaries

X-ray and femtosecond UV photoelectron spectroscopy, secondary ion mass spectrometry and photoluminescence imaging were used to investigate the electronic and elemental properties of the CZTS,Se surface and its oxides. Oxide removal reveals a very Cu poor and Zn rich surface relative to bulk composition. O and Na are observed at the surface and throughout the bulk. Upward bending of the valence bands indicates the presence of negative charge in the surface region and the Fermi level is found near the band gap center. The presence of point defects and the impact of these findings on grain boundary properties will be described.
Authors:
; ; ;  [1]
  1. IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Hts., New York 10598 (United States)
Publication Date:
OSTI Identifier:
22280610
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 3; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COPPER SELENIDES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FERMI LEVEL; GRAIN BOUNDARIES; MASS SPECTROSCOPY; OXIDES; PHOTOELECTRON SPECTROSCOPY; PHOTOLUMINESCENCE; POINT DEFECTS; SURFACES; TIN SELENIDES; VALENCE; X-RAY SPECTROSCOPY; ZINC SULFIDES