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Title: Deep Co penetration and spin-polarization of C{sub 60} molecules at hybridized Co-C{sub 60} interfaces

We used near-edge x-ray absorption fine structure spectroscopy to identify the interplays at organic semiconductor-ferromagnet interfaces. When monitoring the L-edge intensity of 0.36 nm Co depositing on C{sub 60} films of various thicknesses, we detected weaker Co signal from structures with larger C{sub 60} thicknesses. Having determined that the electron mean escape depth in C{sub 60} is 4.9 nm, further model analysis indicates that the decline of spectral intensity is due to deep penetration of Co clusters. Finally, C K-edge spectra reveal clear evidences of orbital hybridization between Co and C{sub 60} as well as a visible dichroic effect at 125 K.
Authors:
; ;  [1] ;  [1] ;  [2] ;  [2] ;  [3] ;  [2] ;  [1] ;  [2] ;  [2]
  1. National Synchrotron Radiation Research Center, 30076 Hsinchu, Taiwan (China)
  2. (China)
  3. Graduate Program for Science and Technology of Synchrotron Light Source, National Tsing Hua University, 30013 Hsinchu, Taiwan (China)
Publication Date:
OSTI Identifier:
22280565
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; COBALT; ELECTRONS; FERROMAGNETIC MATERIALS; FINE STRUCTURE; FULLERENES; INTERFACES; MOLECULES; ORGANIC SEMICONDUCTORS; SPIN ORIENTATION; THICKNESS; THIN FILMS; X-RAY SPECTRA; X-RAY SPECTROSCOPY