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Title: Role of multilayer-like interference effects on the transient optical response of Si{sub 3}N{sub 4} films pumped with free-electron laser pulses

X-ray/optical cross-correlation methods are attracting increasing interest for exploring transient states of matter using ultrashort free-electron laser (FEL) pulses. Our paper shows that in such studies the difference in the penetration depth of the FEL-pump and the infrared (IR) probe pulses become important, in particular, when exploring the changes in the optical properties of solid targets. We discuss the role of interference effects, using a phenomenological model with excited and unperturbed slabs. The reliability of this model was experimentally verified by measuring the transient optical response of free-standing and silicon (Si) supported silicon nitride (Si{sub 3}N{sub 4}) films, simultaneously in reflection and transmission, using s- and p-polarized IR light. The changes in the Si{sub 3}N{sub 4} optical refractive index, induced by the FEL pulses, have fully been described in the frame of the proposed model. The experimental results confirm that the differences, observed in the FEL-induced transient reflectance and transmittance of the Si{sub 3}N{sub 4} targets with different thicknesses, arise from multilayer-like interferometric phenomena.
Authors:
;  [1] ;  [2] ; ; ; ; ; ; ;  [1] ;  [1] ;  [2]
  1. Elettra-Sincrotrone Trieste, SS 14 - km 163.5, I-34149 Basovizza, Trieste (Italy)
  2. (Italy)
Publication Date:
OSTI Identifier:
22280369
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 19; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; FREE ELECTRON LASERS; INTERFERENCE; PENETRATION DEPTH; PUMPS; REFRACTIVE INDEX; SILICON; SILICON NITRIDES; THIN FILMS; X RADIATION