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Title: The influence of semiconductive binary Sb{sub 2}S{sub 3}–Yb{sub 3}S{sub 4} system on electrical conductivity property of epoxy composites

The purpose of this study is to develop the semiconductive composites. Semiconducting glass (SG) binary system Sb{sub 2}S{sub 3}–Yb{sub 3}S{sub 4} in mole ratio 1:1 was synthesized and was doped with I{sub 2}. Next, electrically conductive DGEBA-type epoxy resin (ER)/SG-filled composites and epoxy toluene oligomer (ETO) modified epoxy resin-SG filled composites were developed with 3–10 wt. % of fillers and characterized. As a result, the effects of the modifier and amount of semiconductive filler on the electrical properties of commercial epoxy resin were examined. Percolation concentration was 7 wt. % for all composites. For the SG-reinforced composites, the dispersion of the fillers is investigated by X-ray diffraction (XRD) and by scanning electron microscopy (SEM)
Authors:
; ;  [1]
  1. Department of Chemical Engineering, Faculty of Engineering, Selcuk University, 42031 Konya (Turkey)
Publication Date:
OSTI Identifier:
22280357
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1599; Journal Issue: 1; Conference: 7. international conference on times of polymers (TOP) and composites, Ischia (Italy), 22-26 Jun 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANTIMONY SULFIDES; COMPOSITE MATERIALS; CONCENTRATION RATIO; DISPERSIONS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; EPOXIDES; FILLERS; GLASS; IODINE; REINFORCED MATERIALS; RESINS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TOLUENE; X-RAY DIFFRACTION; YTTERBIUM SULFIDES