Study of relaxation and transport processes by means of AFM based dielectric spectroscopy
- Centro de Física de Materiales CSIC-UPV/EHU, P. M. de Lardizabal 5, 20018 San Sebastian, Spain and Departamento de Física de Materiales UPV/EHU, Fac. de Química, 20080 San Sebastian (Spain)
- Centro de Física de Materiales CSIC-UPV/EHU, P. M. de Lardizabal 5, 20018 San Sebastian, Spain and Donostia International Physics Center, Paseo Manuel de Lardizabal 4, 20018 San Sebastian (Spain)
Since its birth a few years ago, dielectric spectroscopy studies based on atomic force microscopy (AFM) have gained a growing interest. Not only the frequency and temperature ranges have become broader since then but also the kind of processes that can be studied by means of this approach. In this work we analyze the most adequate experimental setup for the study of several dielectric processes with a spatial resolution of a few nanometers by using force mode AFM based dielectric spectroscopy. Proof of concept experiments were performed on PS/PVAc blends and PMMA homopolymer films, for temperatures ranging from 300 to 400 K. Charge transport processes were also studied by this approach. The obtained results were analyzed in terms of cantilever stray contribution, film thickness and relaxation strength. We found that the method sensitivity is strongly coupled with the film thickness and the relaxation strength, and that it is possible to control it by using an adequate experimental setup.
- OSTI ID:
- 22280330
- Journal Information:
- AIP Conference Proceedings, Vol. 1599, Issue 1; Conference: 7. international conference on times of polymers (TOP) and composites, Ischia (Italy), 22-26 Jun 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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