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Title: Controllable nonlinear refraction characteristics in hydrogenated nanocrystalline silicon

Nonlinear refraction (NLR) of hydrogenated nanocrystalline silicon (nc-Si:H) has been investigated through the close aperture Z-scan method. We demonstrate a significant NLR and a unique feature of controllable NLR characteristics between saturable and Kerr NLR with the incident photon energy. We numerically evaluate the proportion of these two mechanisms in different wavelengths by a modified NLR equation. The band tail of nc-Si:H appears to play a crucial role in such NLR responses.
Authors:
; ;  [1] ;  [2]
  1. Laboratory of Condensed Matter Spectroscopy and Opto-Electronic Physics, and Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Department of Physics and Astronomy, and Institute of Solar Energy, Shanghai Jiao Tong University, 800 Dong Chuan Road, Shanghai 200240 (China)
  2. Faculty of Science, Jiangxi University of Science and Technology, 86 Hong Qi Road, Ganzhou, Jiangxi 341000 (China)
Publication Date:
OSTI Identifier:
22278137
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; APERTURES; CRYSTALS; HYDROGENATION; NANOSTRUCTURES; NONLINEAR PROBLEMS; NUMERICAL ANALYSIS; PHOTONS; REFRACTION; SILICON