Controllable nonlinear refraction characteristics in hydrogenated nanocrystalline silicon
Journal Article
·
· Journal of Applied Physics
- Faculty of Science, Jiangxi University of Science and Technology, 86 Hong Qi Road, Ganzhou, Jiangxi 341000 (China)
Nonlinear refraction (NLR) of hydrogenated nanocrystalline silicon (nc-Si:H) has been investigated through the close aperture Z-scan method. We demonstrate a significant NLR and a unique feature of controllable NLR characteristics between saturable and Kerr NLR with the incident photon energy. We numerically evaluate the proportion of these two mechanisms in different wavelengths by a modified NLR equation. The band tail of nc-Si:H appears to play a crucial role in such NLR responses.
- OSTI ID:
- 22278137
- Journal Information:
- Journal of Applied Physics, Vol. 115, Issue 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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