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Title: Gamma radiation induced effects in floppy and rigid Ge-containing chalcogenide thin films

We explore the radiation induced effects in thin films from the Ge-Se to Ge-Te systems accompanied with silver radiation induced diffusion within these films, emphasizing two distinctive compositional representatives from both systems containing a high concentration of chalcogen or high concentration of Ge. The studies are conducted on blanket chalcogenide films or on device structures containing also a silver source. Data about the electrical conductivity as a function of the radiation dose were collected and discussed based on material characterization analysis. Raman Spectroscopy, X-ray Diffraction Spectroscopy, and Energy Dispersive X-ray Spectroscopy provided us with data about the structure, structural changes occurring as a result of radiation, molecular formations after Ag diffusion into the chalcogenide films, Ag lateral diffusion as a function of radiation and the level of oxidation of the studied films. Analysis of the electrical testing suggests application possibilities of the studied devices for radiation sensing for various conditions.
Authors:
;  [1] ; ; ; ;  [2] ;  [3] ;  [4]
  1. Department of Electrical Engineering, Boise State University, 1910 University Dr. Boise, Idaho 83725-2075 (United States)
  2. School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287-9309 (United States)
  3. Department of Physics, Arizona State University, Tempe, Arizona 85287-1504 (United States)
  4. Department of Material Science and Engineering, Boise State University, 1910 University Dr. Boise, Idaho 83725-2090 (United States)
Publication Date:
OSTI Identifier:
22275829
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CONCENTRATION RATIO; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRICAL TESTING; GAMMA RADIATION; GERMANIUM SELENIDES; GERMANIUM TELLURIDES; OXIDATION; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; RAMAN SPECTROSCOPY; SILVER; THIN FILMS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY