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Title: Multi-scale simulation of lithium diffusion in the presence of a 30° partial dislocation and stacking fault in Si

The multi-scale simulation method is employed to investigate how defects affect the performances of Li-ion batteries (LIBs). The stable positions, binding energies and dynamics properties of Li impurity in Si with a 30° partial dislocation and stacking fault (SF) have been studied in comparison with the ideal crystal. It is found that the most table position is the tetrahedral (T{sub d}) site and the diffusion barrier is 0.63 eV in bulk Si. In the 30° partial dislocation core and SF region, the most stable positions are at the centers of the octagons (Oct-A and Oct-B) and pentahedron (site S), respectively. In addition, Li dopant may tend to congregate in these defects. The motion of Li along the dislocation core are carried out by the transport among the Oct-A (Oct-B) sites with the barrier of 1.93 eV (1.12 eV). In the SF region, the diffusion barrier of Li is 0.91 eV. These two types of defects may retard the fast migration of Li dopant that is finally trapped by them. Thus, the presence of the 30° partial dislocation and SF may deactivate the Li impurity and lead to low rate capability of LIB.
Authors:
; ; ;  [1] ;  [2] ; ;  [3]
  1. College of Aerospace and Civil Engineering, Harbin Engineering University, Harbin 150001 (China)
  2. School of Chemistry and Chemical Engineering, Nanjing University, Nanjing 210093 (China)
  3. Department of Astronautical Science and Mechanics, Harbin Institute of Technology, Harbin 150001 (China)
Publication Date:
OSTI Identifier:
22275828
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BINDING ENERGY; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CRYSTALS; DISLOCATIONS; LITHIUM; LITHIUM IONS; SILICON; STACKING FAULTS; TRAPPING