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Title: Magnetic and high frequency properties of nanogranular CoFe-yttrium-doped zirconia films

Soft magnetic nanogranular FeCo-Yttrium-doped Zirconia thin films were fabricated using RF magnetron sputtering at different sputtering power. It was found that film electrical resistivity (ρ) decreased steeply with the increase of sputtering power, while both saturation magnetization (4πM{sub s}) and natural ferromagnetic resonant frequency (ƒ{sub r}) increased with the sputtering power ascending from 100 W to 200 W, but decreased when sputtering power exceeded 200 W. X-ray diffraction analysis and transmission electron microscopy confirmed that the films were nanocrystalline/amorphous composites. A saturation magnetization as high as 15.4 kGs and a ferromagnetic resonance frequency above 3 GHz were obtained.
Authors:
; ;  [1] ;  [2]
  1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054 (China)
  2. Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716 (United States)
Publication Date:
OSTI Identifier:
22275588
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; AMORPHOUS STATE; COMPOSITE MATERIALS; COPPER; CRYSTALS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; FERROMAGNETIC RESONANCE; FERROMAGNETISM; INTERFACES; INTERMETALLIC COMPOUNDS; IRON; MAGNETIZATION; NANOSTRUCTURES; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS; ZIRCONIUM OXIDES