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Title: Electronic density-of-states of amorphous vanadium pentoxide films: Electrochemical data and density functional theory calculations

Thin films of V{sub 2}O{sub 5} were prepared by sputter deposition onto transparent and electrically conducting substrates and were found to be X-ray amorphous. Their electrochemical density of states was determined by chronopotentiometry and displayed a pronounced low-energy peak followed by an almost featureless contribution at higher energies. These results were compared with density functional theory calculations for amorphous V{sub 2}O{sub 5}. Significant similarities were found between measured data and computations; specifically, the experimental low-energy peak corresponds to a split-off part of the conduction band apparent in the computations. Furthermore, the calculations approximately reproduce the experimental band gap observed in optical measurements.
Authors:
; ; ;  [1] ;  [2] ; ;  [2] ;  [3]
  1. Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala (Sweden)
  2. Department of Physics and Astronomy, The Ångström Laboratory, Uppsala University, P.O. Box 516, SE-75120 Uppsala (Sweden)
  3. (KTH), SE-100 44 Stockholm (Sweden)
Publication Date:
OSTI Identifier:
22275569
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 18; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APPROXIMATIONS; COMPARATIVE EVALUATIONS; DENSITY FUNCTIONAL METHOD; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRONIC STRUCTURE; ENERGY GAP; ENERGY-LEVEL DENSITY; SPUTTERING; SUBSTRATES; THIN FILMS; VANADIUM OXIDES