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Title: Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal.
Authors:
;  [1] ;  [2] ;  [3] ; ;  [1] ;  [3] ;  [1] ;  [2]
  1. Centro de Física de Materiales (CSIC-UPV/EHU), P. M. de Lardizabal 5, 20018 San Sebastián (Spain)
  2. (Spain)
  3. (UPV/EHU), 20080 San Sebastián (Spain)
Publication Date:
OSTI Identifier:
22275555
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 18; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; FREQUENCY DEPENDENCE; MOLECULAR DYNAMICS METHOD; NANOSTRUCTURES; PERMITTIVITY; SENSITIVITY; SPATIAL RESOLUTION; SPECTROSCOPY