skip to main content

Title: Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films

Growth of nm-thick yttrium iron garnet (YIG) films by sputtering and ferromagnetic resonance (FMR) properties in the films were studied. The FMR linewidth of the YIG film decreased as the film thickness was increased from several nanometers to about 100 nm. For films with very smooth surfaces, the linewidth increased linearly with frequency. In contrast, for films with big grains on the surface, the linewidth-frequency response was strongly nonlinear. Films in the 7–26 nm thickness range showed a surface roughness between 0.1 nm and 0.4 nm, a 9.48-GHz FMR linewidth in the 6–10 Oe range, and a damping constant of about 0.001.
Authors:
 [1] ;  [2] ; ; ; ;  [1] ; ;  [3] ;  [4]
  1. Department of Physics, Colorado State University, Fort Collins, Colorado 80523 (United States)
  2. (China)
  3. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  4. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)
Publication Date:
OSTI Identifier:
22273943
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; DAMPING; FERRITE GARNETS; FERROMAGNETIC RESONANCE; GHZ RANGE; IRON OXIDES; NONLINEAR PROBLEMS; ROUGHNESS; SPUTTERING; SURFACES; THICKNESS; THIN FILMS; YTTRIUM COMPOUNDS