skip to main content

SciTech ConnectSciTech Connect

Title: Magnetic and microwave properties of U-type hexaferrite films with high remanence and low ferromagnetic resonance linewidth

U-type barium hexaferrite films (Ba{sub 4}Ni{sub 1.4}Co{sub 0.6}Fe{sub 36}O{sub 60}) were deposited on (0001) sapphire substrates by pulsed laser deposition. Microstructure and magnetic properties of the films were characterized by X-ray diffraction, scanning electron microscopy and vibrating sample magnetometry. Ferromagnetic resonance (FMR) measurements were performed at X-band. The results indicate an anisotropy field of ∼8 kOe, and the saturation magnetization (4πM{sub s}) of ∼3.6 kG. An optimal post-deposition annealing of films results in a strong (0 0 n) crystallographic texture and a high hysteresis loop squareness (M{sub r}/M{sub s} = 92%) leading to self biased properties. Furthermore, the highly self-biased ferrite films exhibited an FMR linewidth of ∼200 Oe. The U-type hexaferrite films having low microwave loss, low magnetic anisotropy field, and high squareness are a suitable alternative to Sc or In doped BaM ferrites that have been the choice material for self-biased microwave devices at X-band frequencies.
Authors:
; ; ; ;  [1]
  1. Center for Microwave Magnetic Materials and Integrated Circuits, Northeastern University, Boston, Massachusetts 02115, USA and The Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115 (United States)
Publication Date:
OSTI Identifier:
22273925
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANISOTROPY; BARIUM COMPOUNDS; COBALT COMPOUNDS; CRYSTAL STRUCTURE; DOPED MATERIALS; ENERGY BEAM DEPOSITION; FERRITES; FERROMAGNETIC RESONANCE; HYSTERESIS; LASER RADIATION; MAGNETIC PROPERTIES; MAGNETIZATION; MICROSTRUCTURE; MICROWAVE RADIATION; NICKEL COMPOUNDS; PULSED IRRADIATION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION