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Title: Growth and characterization of nonpolar, heavily Mn-substituted ZnO films

Eight percent of Mn was successfully diluted into nonpolar ZnO films deposited by pulsed laser deposition on single crystal (100) SrTiO{sub 3} substrates. X-ray diffraction patterns and energy-dispersive X-ray spectroscopy confirmed high crystallinity of the films and excluded unintentional magnetic doping. A unique surface domain structure was observed by scanning electron microscope and atomic force microscope, which might play a vital role to strain release induced by lattice mismatch between nonpolar (11–20) ZnO film and (100) SrTiO{sub 3} substrate. In addition, the films showed strong ferromagnetism with a large coercivity H{sub C} ∼ 180 Oe at room temperature. The large magnetic moment is ascribed to carrier-mediated exchange interaction between the Mn ions, where the majority of the carriers are oxygen vacancies.
Authors:
; ; ; ;  [1] ;  [2]
  1. Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong SAR (China)
  2. Department of Applied Physics and Materials Research Centre, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong SAR (China)
Publication Date:
OSTI Identifier:
22273901
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; CRYSTAL GROWTH; DOMAIN STRUCTURE; ENERGY BEAM DEPOSITION; EXCHANGE INTERACTIONS; FERROMAGNETISM; LASER RADIATION; MAGNETIC MOMENTS; MANGANESE IONS; MONOCRYSTALS; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; VACANCIES; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY; ZINC OXIDES