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Title: Micro-Raman study on the softening and stiffening of phonons in rutile titanium dioxide film: Competing effects of structural defects, crystallite size, and lattice strain

Softening and stiffening of phonons in rutile titanium dioxide films are investigated by in situ micro-Raman studies during energetic ion irradiation. The in situ study minimized other possible mechanisms of phonon dynamics. Initial softening and broadening of Raman shift are attributed to the phonon confinement by structural defects and loss of stoichiometry. The stiffening of A{sub 1g} mode is ascribed to large distortion of TiO{sub 6} octahedra under the influence of lattice strain in the (110) plane, which gives rise to lengthening of equatorial Ti-O bond and shortening of apical Ti-O bond. The shortening of apical Ti-O bond induces stiffening of A{sub 1g} mode in the framework of the bond-order-length-strength correlation mechanism.
Authors:
; ; ;  [1] ;  [2] ;  [3]
  1. Materials Science Group, Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067 (India)
  2. Department of Physics, Bhagini Nivedita College, Delhi University, Delhi 110043 (India)
  3. Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Germany)
Publication Date:
OSTI Identifier:
22273631
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 14; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CHEMICAL BONDS; CORRELATIONS; CRYSTAL DEFECTS; CRYSTAL LATTICES; IRRADIATION; PHONONS; PHYSICAL RADIATION EFFECTS; RAMAN SPECTROSCOPY; RUTILE; STRAINS; TAIL IONS; THIN FILMS; TITANIUM OXIDES