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Title: 1/f noise in semiconductor and metal nanocrystal solids

Electrical 1/f noise is measured in thin films of CdSe, CdSe/CdS, ZnO, HgTe quantum dots and Au nanocrystals. The 1/f noise, normalized per nanoparticle, shows no systematic dependence on the nanoparticle material and the coupling material. However, over 10 orders of magnitude, it correlates well with the nearest neighbor conductance suggesting some universal magnitude of the 1/f noise in these granular conductors. In the hopping regime, the main mechanism of 1/f noise is determined to be mobility fluctuated. In the metallic regime obtained with gold nanoparticle films, the noise drops to a similar level as bulk gold films and with a similar temperature dependence.
Authors:
; ;  [1]
  1. James Franck Institute, The University of Chicago, 929 E 57th Street, Chicago, Illinois 60637 (United States)
Publication Date:
OSTI Identifier:
22273575
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; CADMIUM SELENIDES; CADMIUM SULFIDES; CARRIER MOBILITY; COUPLING; GOLD; MERCURY TELLURIDES; NOISE; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SOLIDS; TEMPERATURE DEPENDENCE; THIN FILMS; ZINC OXIDES