skip to main content

SciTech ConnectSciTech Connect

Title: Simulation and analysis of grating-integrated quantum dot infrared detectors for spectral response control and performance enhancement

We propose and analyze a novel detector structure for pixel-level multispectral infrared imaging. More specifically, we investigate the device performance of a grating-integrated quantum dots-in-a-well photodetector under backside illumination. Our design uses 1-dimensional grating patterns fabricated directly on a semiconductor contact layer and, thus, adds a minimal amount of additional effort to conventional detector fabrication flows. We show that we can gain wide-range control of spectral response as well as large overall detection enhancement by adjusting grating parameters. For small grating periods, the spectral responsivity gradually changes with parameters. We explain this spectral tuning using the Fabry–Perot resonance and effective medium theory. For larger grating periods, the responsivity spectra get complicated due to increased diffraction into the active region, but we find that we can obtain large enhancement of the overall detector performance. In our design, the spectral tuning range can be larger than 1 μm, and, compared to the unpatterned detector, the detection enhancement can be greater than 92% and 148% for parallel and perpendicular polarizations. Our work can pave the way for practical, easy-to-fabricate detectors, which are highly useful for many infrared imaging applications.
Authors:
 [1] ;  [2] ; ;  [3] ;  [1] ; ;  [4] ;  [5]
  1. Center for High Technology Materials, University of New Mexico, Albuquerque, New Mexico 87106 (United States)
  2. (Korea, Republic of)
  3. Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433 (United States)
  4. Division of Industrial Metrology, Korea Research Institute of Standards and Science, Daejeon 305-340 (Korea, Republic of)
  5. Department of Physics, Inha University, Incheon 402-751 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22273530
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DIFFRACTION; GAIN; INFRARED RADIATION; LAYERS; PERFORMANCE; POLARIZATION; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SPECTRAL RESPONSE