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Title: In situ controlled modification of the helium density in single helium-filled nanobubbles

We demonstrate that the helium density and corresponding pressure can be modified in single nano-scale bubbles embedded in semiconductors by using the electron beam of a scanning transmission electron microscope as a multifunctional probe: the measurement probe for imaging and chemical analysis and the irradiation source to modify concomitantly the pressure in a controllable way by fine tuning of the electron beam parameters. The control of the detrapping rate is achieved by varying the experimental conditions. The underlying physical mechanisms are discussed; our experimental observations suggest that the helium detrapping from bubbles could be interpreted in terms of direct ballistic collisions, leading to the ejection of the helium atoms from the bubble.
Authors:
;  [1] ;  [2] ; ; ;  [1] ; ;  [3] ;  [2]
  1. Institut Pprime, UPR 3346 CNRS-Université de Poitiers, SP2MI, 86962 Futuroscope-Chasseneuil cedex (France)
  2. (Canada)
  3. Canadian Centre for Electron Microscopy, Mc Master University, 1280 Main Street West, Hamilton, Ontario L8S 4M1 (Canada)
Publication Date:
OSTI Identifier:
22271170
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 12; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ATOMS; BUBBLES; CHEMICAL ANALYSIS; DENSITY; ELECTRON BEAMS; HELIUM; IRRADIATION; MODIFICATIONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY